Surface to surface transition probabilities in thin film capacitors
- 16 July 1974
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 24 (1) , K39-K44
- https://doi.org/10.1002/pssa.2210240146
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Time constant of the voltage step response in thin film capacitorsPhysica Status Solidi (a), 1973
- Dispersion characteristics of thin films capacitances caused by surface trappingThin Solid Films, 1971
- Instability in vacuum deposited silicon oxideIEEE Transactions on Electron Devices, 1967
- The Si-SiO2Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance TechniqueBell System Technical Journal, 1967
- Statistics of the Recombinations of Holes and ElectronsPhysical Review B, 1952