A pulsed EDMR study of hydrogenated microcrystalline silicon at low temperatures
- 16 March 2004
- journal article
- review article
- Published by Wiley in physica status solidi (c)
- Vol. 1 (5) , 1255-1274
- https://doi.org/10.1002/pssc.200304326
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Electrical Detection of Spin Coherence in SiliconPhysical Review Letters, 2003
- Theory of time-domain measurement of spin-dependent recombination with pulsed electrically detected magnetic resonancePhysical Review B, 2003
- Defects and recombination in microcrystalline siliconSolar Energy Materials and Solar Cells, 2003
- Recombination in silicon thin-film solar cells: a study of electrically detected magnetic resonanceIEE Proceedings - Circuits, Devices and Systems, 2003
- Quantum-beat recombination echoesEurophysics Letters, 2001
- Defect and Tail States in Microcrystalline Silicon investigated by pulsed ESRMRS Proceedings, 2000
- Electron spin resonance investigation of electronic states in hydrogenated microcrystalline siliconPhysical Review B, 1999
- Structure and growth of hydrogenated microcrystalline silicon: Investigation by transmission electron microscopy and Raman spectroscopy of films grown at different plasma excitation frequenciesPhilosophical Magazine A, 1997
- Pulsed ESR Study of the Conduction Electron Spin Center in μc-Si:HMRS Proceedings, 1996
- Explanation of the large spin-dependent recombination effect in semiconductorsJournal de Physique Lettres, 1978