Studies of crystalline defects during the early stages of growth of Si on Si(100) at low temperatures by spot profile analysis of LEED (SPA-LEED)
- 1 May 1992
- journal article
- Published by Elsevier in Surface Science
- Vol. 269-270, 14-21
- https://doi.org/10.1016/0039-6028(92)91221-v
Abstract
No abstract availableKeywords
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