A new LEED instrument for quantitative spot profile analysis
- 1 December 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 178 (1-3) , 441-451
- https://doi.org/10.1016/0039-6028(86)90321-3
Abstract
No abstract availableKeywords
All Related Versions
This publication has 9 references indexed in Scilit:
- Low-energy electron diffraction system using a position-sensitive detectorReview of Scientific Instruments, 1985
- Defects at semiconductor surfacesSurface Science, 1985
- Instrumentation for low-energy electron diffractionReview of Scientific Instruments, 1983
- The present status of low-energy electron diffractionApplications of Surface Science, 1982
- LEED studies of surface imperfectionsApplications of Surface Science, 1982
- Epitaxy of Si(111) as studied with a new high resolving LEED systemSurface Science, 1982
- Leed studies of the first stages of deposition and melting of lead on low index faces of copperSurface Science, 1972
- Low-energy electron diffraction from imperfect structuresSurface Science, 1970
- Resistance bias characteristic of the electron microscope gunBritish Journal of Applied Physics, 1958