SEU and SEL response of the Westinghouse 64K E/sup 2/PROM, Analog Devices AD7876 12-bit ADC, and the Intel 82527 serial communications controller

This publication has 7 references indexed in Scilit:

• Design considerations for a radiation hardened nonvolatile memory
  IEEE Transactions on Nuclear Science, 1993
• The relationship of proton and heavy ion upset thresholds
  IEEE Transactions on Nuclear Science, 1992
• Two parameter Bendel model calculations for predicting proton induced upset (ICs)
  IEEE Transactions on Nuclear Science, 1990
• SEU characterization of a hardened CMOS 64K and 256K SRAM
  IEEE Transactions on Nuclear Science, 1989
• On Heavy Ion Induced Hard-Errors in Dielectric Structures
  IEEE Transactions on Nuclear Science, 1987
• Proton Upsets in Orbit
  IEEE Transactions on Nuclear Science, 1983
• The Variability of Single Event Upset Rates in the Natural Environment
  IEEE Transactions on Nuclear Science, 1983