Investigations of long-term propagation margins in ion-implanted contiguous-disk bubble devices
- 1 March 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 16 (2) , 416-423
- https://doi.org/10.1109/tmag.1980.1060600
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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- Charged wall behavior in 1-µm bubble implanted structuresIEEE Transactions on Magnetics, 1978
- Experimental techniques for studying the reliability of bubble memory devicesJournal of Applied Physics, 1977
- The probability of information loss at the edges of bubble propagation marginsIEEE Transactions on Magnetics, 1976
- Long-term testing of 68 kbit bubble device chipsIEEE Transactions on Magnetics, 1976
- The effect of DC in plane field on the operation of field access bubble memory devicesIEEE Transactions on Magnetics, 1976
- Spontaneous annihilations in magnetic bubble propagationJournal of Applied Physics, 1975
- Long-Term Propagation Studies in Magnetic-Bubble DevicesPublished by AIP Publishing ,1974