The effects of 6 keV Ar+ ion bombardment on the surface composition of simple and complex titanium oxides
- 1 April 1995
- Vol. 46 (4) , 363-368
- https://doi.org/10.1016/0042-207x(94)00080-8
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- XPS and ISS study of NiTiO3 and PbTiO3 subjected to low‐energy ion bombardment. I. Influence of the type of ion (Ar+ and O)Surface and Interface Analysis, 1993
- Calculation of core level chemical shifts for the adsorption of alkali metals on Si(111)Journal of Physics: Condensed Matter, 1993
- An XPS study of the mixing effects induced by ion bombardment in composite oxidesApplied Surface Science, 1993
- Chemical changes induced by sputtering in TiO2 and some selected titanates as observed by X-ray absorption spectroscopySurface Science, 1993
- Mixing effects in CeO2/TiO2 and CeO2/SiO2 systems submitted to Ar+ sputteringJournal of Vacuum Science & Technology A, 1993
- The dissociation of transition metal oxides under exposure to low energy ionsVacuum, 1990
- Sputter reduction of oxides by ion bombardment during Auger depth profile analysisSurface and Interface Analysis, 1990
- Compositional changes induced by 3.5 keV Ar+ ion bombardment in Ni-Ti oxide systemsSurface Science, 1989
- Bombardment-induced compositional change with alloys, oxides, oxysalts and halides III. The role of chemical driving forcesMaterials Science and Engineering: A, 1989
- XPS and auger spectroscopy studies on mixtures of the oxides SiO2, Al2O3, Fe2O3 and Cr2O3Journal of Electron Spectroscopy and Related Phenomena, 1987