A new device architecture suitable for high-resolution and high-performance image sensors
- 1 May 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 35 (5) , 646-652
- https://doi.org/10.1109/16.2508
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Smear reduction in the interline CCD image sensorIEEE Transactions on Electron Devices, 1987
- A line-address CCD image sensorPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1987
- A new MOS image sensor operating in a non-destructive readout modePublished by Institute of Electrical and Electronics Engineers (IEEE) ,1986