Etude des phénomènes de conduction et de bruit de fond basse fréquence associés aux régions superficielles des jonctions p–n. Application au transistor à jonctions

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• Excess surface currents in p-n junctions and bipolar transistors
  Solid-State Electronics, 1971
• Surface state related noise in MOS transistors
  Solid-State Electronics, 1970
• Surface recombination in semiconductors
  Surface Science, 1968
• The Si-SiO₂Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique
  Bell System Technical Journal, 1967
• Flicker noise in transistors
  IEEE Transactions on Electron Devices, 1963