Thickness-dependent relaxation of NiO(001) overlayers on MgO(001) studied by X-ray diffraction
- 21 August 1999
- journal article
- Published by Elsevier in Surface Science
- Vol. 433-435, 718-722
- https://doi.org/10.1016/s0039-6028(99)00476-8
Abstract
No abstract availableKeywords
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