High resolution imaging properties of the stem
- 31 December 1975
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 1 (2) , 137-144
- https://doi.org/10.1016/s0304-3991(75)80016-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- New Values for the Partial Wave Electron Scattering Factor for the Elements 1≤Z≤57 and 72≤Z≤90 for Incident Electron Energies of 10, 40, 70, and 100 keVThe Journal of Chemical Physics, 1971
- Zur Streuung mittelschneller Elektronen in kleinste WinkelZeitschrift für Naturforschung A, 1954