Sensitivity Analysis for Device Design
- 1 September 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 6 (5) , 879-885
- https://doi.org/10.1109/tcad.1987.1270330
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- VLSI Yield Prediction and Estimation: A Unified FrameworkIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986
- Parameter Extraction for Statistical IC Process CharacterizationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986
- An Integrated and Efficient Approach for MOS VLSI Statistical Circuit DesignIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986
- Transient Sensitivity Computation for MOSFET CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1985
- A General Control-Volume Formulation for Modeling Impact Ionization in Semiconductor TransportIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1985
- Iterative methods in semiconductor device simulationIEEE Transactions on Electron Devices, 1985
- Device modelingProceedings of the IEEE, 1983
- Physics of Submicron DevicesPublished by Springer Nature ,1982
- Computer-aided two-dimensional analysis of bipolar transistorsIEEE Transactions on Electron Devices, 1973
- Large-signal analysis of a silicon Read diode oscillatorIEEE Transactions on Electron Devices, 1969