Parameter Extraction for Statistical IC Process Characterization
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 5 (1) , 66-78
- https://doi.org/10.1109/tcad.1986.1270178
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- FABRICS II: A Statistically Based IC Fabrication Process SimulatorIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1984
- A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and ModelingIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1984
- Optimized Extraction of MOS Model ParametersIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1982
- Statistical Simulation of the IC Manufacturing ProcessIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1982