Investigation of Phase Noise of Ring Oscillators With Time-Varying Current and Noise Sources by time-scaling Thermal Noise
- 18 October 2004
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems I: Regular Papers
- Vol. 51 (10) , 1926-1939
- https://doi.org/10.1109/tcsi.2004.835688
Abstract
This paper presents a new methodology of analyzing phase noise in a ring oscillator by time-scaling the thermal noise. Close-form solutions that relate the probability distribution and power-spectral density of the phase noise to circuit parameters have been obtained. These close-form solutions characterize the behavior of phase noise even when the circuit is varying with time in a nonlinear fashion. Specifically, the theory predicts that for a given oscillation frequency, phase noise roughly decreases as the cube of the delay cell charging current value at threshold crossing; thus, it provides new design insights. Simulations were run and verified this dependency.Keywords
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