Phase imaging as an extension to tapping mode AFM for the identification of material properties on humidity-sensitive surfaces
- 1 June 1997
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 115 (2) , 190-198
- https://doi.org/10.1016/s0169-4332(97)80204-8
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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