An AlN/GaN insulated gate heterostructure field effect transistor with regrown n+GaN source and drain contact
- 15 June 1998
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 189-190, 738-741
- https://doi.org/10.1016/s0022-0248(98)00276-0
Abstract
No abstract availableKeywords
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