Phase-shift measurement in photorefractive holographic recording
- 1 July 1989
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 66 (1) , 47-49
- https://doi.org/10.1063/1.343854
Abstract
A simple direct method for measuring the interference pattern of a light-to-recorded hologram phase shift in photorefractive crystals is reported. The method is used for studying the recording in Bi12SiO20 under an externally applied electric field. The results are then compared with theory and used for computing the density of photoelectron traps.This publication has 9 references indexed in Scilit:
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