Routine Crystallite-Size Determination by X-Ray Diffraction Line Broadening
- 1 January 1961
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 5, 104-116
- https://doi.org/10.1154/s0376030800001476
Abstract
Increasing interest in the sintering characteristics of various ceramic materials has resulted in the need for a knowledge of the crystallite sizes of many constituent ceramic powders. Standard X-ray diffraction line-broadening techniques have been utilized to determine these crystallite sizes. This paper presents a general review of the theory of line broadening as a means of measuring crystallite size and gives the methods and modifications used to perform this type of analysis rapidly and on a routine basis. Four modifications have been used in the determination of crystallite size routinely by X-ray line broadening. These methods are (1) a graded set of powder photographs, (2) a computer program to calculate sizes from diffractometer data, (3) a set of crystallite-size curves for a given material for use with diffractometer data, and (4) a standard set of curves to use with diffractometer data for any strain-free materials. The preparation, use, and limitations of each of these methods is presented.Keywords
This publication has 4 references indexed in Scilit:
- Crystallite Size and Particle Size Measurements on BeO Powders by X-Ray MethodsPublished by Springer Nature ,1961
- X-Ray Diffraction Investigation of BeO Calcination ProcessesPublished by Springer Nature ,1961
- The Synthesis of X-Ray Spectrometer Line Profiles with Application to Crystallite Size MeasurementsJournal of Applied Physics, 1954
- The measurement of particle size by the X-ray methodProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1938