Shock launching in silicon studied with use of pulsed x-ray diffraction
- 15 June 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 35 (17) , 9391-9394
- https://doi.org/10.1103/physrevb.35.9391
Abstract
Multikilobar shocks were launched into a single crystal of (111) silicon coated with 1000 Å of aluminum and a 25-μm transparent plastic layer by irradiation with a 1-nsec pulse of 1.06-μm laser light at 0.8–8 J . Peak lattice compressions were directly measured and shocked-lattice stresses inferred as a function of irradiance and time by Bragg-diffracting a short (<100 psec) burst of probing x rays through the shock-launching region. Compressions of up to ∼4% were measured, corresponding to stresses of the order of 70 kbar, at irradiances of ∼4× W .
Keywords
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