Quantitative trace element determination in thin samples by total reflection x‐ray fluorescence using the scattered radiation method
- 1 October 1988
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 17 (5) , 171-174
- https://doi.org/10.1002/xrs.1300170503
Abstract
It is shown that samples exposed under total reflection conditions obey the relationship Ii/Iinc = KCi, where Ii is the x‐ray fluorescence intensity due to element i of concentration Ci, Iinc is the intensity of the scattered incoherent radiation and K is a constant. An experiment on the determination of sulphur in diesel fuel confirmed this derivation. This relationship affords a simple and fast method for quantitative trace element determination, requiring virtually no sample preparation and extremely small amounts (<Iμl). Other advantages include its insensitivity to instrumental variations and changes in excitation conditions or in sample characteristics such as particle size and sample amount.Keywords
This publication has 3 references indexed in Scilit:
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- Progress in X-Ray Fluorescence Correction Methods Using Scattered RadiationPublished by Springer Nature ,1979
- Scattered X-Rays as Internal Standards in X-Ray Emission SpectroscopyAnalytical Chemistry, 1958