Surface topology changes during electromigration in metallic thin film stripes
- 1 September 1969
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 4 (3) , 187-204
- https://doi.org/10.1016/0040-6090(69)90035-2
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- DIRECT TRANSMISSION ELECTRON MICROSCOPE OBSERVATION OF ELECTROTRANSPORT IN ALUMINUM THIN FILMSApplied Physics Letters, 1967
- ELECTROMIGRATION EFFECTS IN ALUMINUM FILM ON SILICON SUBSTRATESApplied Physics Letters, 1967
- SOME OBSERVATIONS ON THE ELECTROMIGRATION IN ALUMINUM FILMSApplied Physics Letters, 1967
- Electromigration and void observation in silverJournal of Physics and Chemistry of Solids, 1966
- Current-induced mass transport in aluminumJournal of Physics and Chemistry of Solids, 1964