High-resolution imaging with an aberration-corrected transmission electron microscope
Top Cited Papers
- 31 August 2002
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 92 (3-4) , 233-242
- https://doi.org/10.1016/s0304-3991(02)00139-0
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- How to optimize the design of a quantitative HREM experiment so as to attain the highest precisionJournal of Microscopy, 1999
- A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscopeJournal of Electron Microscopy, 1999
- A spherical-aberration-corrected 200kV transmission electron microscopeUltramicroscopy, 1998
- Electron microscopy image enhancedNature, 1998
- Towards 0.1 nm resolution with the first spherically corrected transmission electron microscopeJournal of Electron Microscopy, 1998
- Optimum focus for taking electron hologramsUltramicroscopy, 1991
- Periodicity of crystal structure images in electron microscopy with crystal thicknessPhysica Status Solidi (a), 1978
- Interpretation of Electron Channeling by the Dynamical Theory of Electron DiffractionZeitschrift für Naturforschung A, 1974
- Diffraction channelling of fast electrons and positrons in crystalsPhilosophical Magazine, 1966
- The Theoretical Resolution Limit of the Electron MicroscopeJournal of Applied Physics, 1949