A spherical-aberration-corrected 200kV transmission electron microscope
- 1 October 1998
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 75 (1) , 53-60
- https://doi.org/10.1016/s0304-3991(98)00048-5
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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