X-Y plotter capacitance meter interface for deep level spectroscopy
- 1 March 1981
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 14 (3) , 367-372
- https://doi.org/10.1088/0022-3735/14/3/023
Abstract
Describes an interface device to be inserted into a capacitance spectroscopy characterisation system, between a commercial capacitance meter and a X-Y recorder. This interface samples its input signal using classical electronic components. These samples are processed giving an output proportional to C(t2)-C(t1), and whose amplitude varies when the temperature sweeps from 77K to 450K. The rate window extends from 10-1 s-1 to 103 s-1. The sensitivity for detecting the number of traps is about 1/1000 of the free carrier concentration.Keywords
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