Ionization Threshold Observed in Noise from Silicon Zener Diodes
- 1 January 1966
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (1) , 463-464
- https://doi.org/10.1063/1.1707887
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Charge multiplication in silicon p-n junctionsSolid-State Electronics, 1963
- Threshold Energy for Electron-Hole Pair-Production by Electrons in SiliconPhysical Review B, 1957
- Internal Field Emission in SiliconJunctionsPhysical Review B, 1957