Optimization of small electron probes
- 31 December 1987
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 23 (2) , 159-167
- https://doi.org/10.1016/0304-3991(87)90161-6
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Chromatic aberration effects in small electron probesUltramicroscopy, 1987
- On the optimum resolution for a corrected STEMUltramicroscopy, 1982
- Application of a thermal field emission source for high resolution, high current e-beam microprobesJournal of Vacuum Science and Technology, 1979