Doping inhomogeneities in semiconductors measured by electroreflectance
- 30 June 1973
- journal article
- Published by Elsevier in Surface Science
- Vol. 37, 987-993
- https://doi.org/10.1016/0039-6028(73)90384-1
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Doping inhomogeneities in silicon observed by a high-resolution electroreflectance techniquePhysica Status Solidi (a), 1972