Temperature-dependent resistivity measurements on polycrystalline SiO2-covered thin gold films
- 1 July 1987
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 150 (2-3) , 201-208
- https://doi.org/10.1016/0040-6090(87)90091-5
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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