Method for producing large Si films for preselected imperfection analysis
- 1 April 1965
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 42 (4) , 270-272
- https://doi.org/10.1088/0950-7671/42/4/322
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Method of preparing Si and Ge specimens for examination by transmission electron microscopyBritish Journal of Applied Physics, 1962
- Stacking Faults in Epitaxial SiliconJournal of Applied Physics, 1962
- Sample Preparation for Transmission Electron Microscopy of GermaniumReview of Scientific Instruments, 1961