Calibration of a Si(Li) detector system with different radiation entrance windows
- 1 March 1991
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 62 (3) , 741-743
- https://doi.org/10.1063/1.1142077
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Semiconductor photodiodes in the VUV: Determination of layer thicknesses and design criteria for improved devicesNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1990
- Complete characterization of a Si(Li) detector in the photon energy range 0.9–5 keVReview of Scientific Instruments, 1989
- Beamline for the characterization of radiation transfer standards ranging from 200 to 2000 eVReview of Scientific Instruments, 1989
- Description of low‐energy peak distortion observed in X‐ray spectrometry with Si(Li) detectorsX-Ray Spectrometry, 1987
- Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflectionAtomic Data and Nuclear Data Tables, 1982
- Photon cross sections from 0.1 keV to 1 MeV for elements Z = 1 to Z = 94Atomic Data and Nuclear Data Tables, 1973