Soft x-ray reflection from silicon and quartz mirrors
- 1 February 1988
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 27 (3) , 563-566
- https://doi.org/10.1364/ao.27.000563
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 10 references indexed in Scilit:
- Soft x-ray reflection from SiC, TiC, and WC mirrorsApplied Optics, 1986
- Measurement of surface topography of magnetic tapes by Mirau interferometryApplied Optics, 1985
- High-resolution measurements of angle-resolved X-ray scattering from optically flat mirrorsJournal of Applied Crystallography, 1984
- Measurement of optical properties of materials in the vacuum ultraviolet spectral regionApplied Optics, 1982
- Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflectionAtomic Data and Nuclear Data Tables, 1982
- The Atomic Scattering Factor, f1+if2, for 94 Elements and for the 100 to 2000 eV Photon Energy RegionAIP Conference Proceedings, 1981
- Scattering of electromagnetic waves from a rough surface. IIJournal of Applied Physics, 1978
- Scattering of an electromagnetic wave from a very rough semi-infinite dielectric plane (exact treatment of the boundary conditions)Journal of Applied Physics, 1978
- Reevaluation of X-Ray Atomic Energy LevelsReviews of Modern Physics, 1967
- Relation Between Surface Roughness and Specular Reflectance at Normal IncidenceJournal of the Optical Society of America, 1961