Ion beam analysis with a 6 MV van de Graaff

This publication has 7 references indexed in Scilit:

• Silicon surface barrier detector resolution in the 2–30 MeV range
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
• Cross sections for 170° backscattering of 4He from oxygen, aluminum and argon for 4He energies between 1.8 and 5.0 MeV
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
• Permalloy stoichiometry by nuclear backscattering
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
• Applications of Heavy-Ion Rutherford Backscattering Spectrometry (HIRBS) to the analysis of contact structures on GaAs and Ge
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
• Heavy ion Rutherford scattering for target profiling, and measurement of heavy element concentrations and isotopic ratios
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
• New precision technique for measuring the concentration versus depth of hydrogen in solids
  Applied Physics Letters, 1976
• Spin and parity assignments for 35Cl levels from the 31P(α, p)34S reaction
  Nuclear Physics A, 1975