Electrical characterization of nanocrystalline Si films by scanning tunnelling spectroscopy and beam-induced current in the scanning tunnelling microscope
- 18 December 2002
- journal article
- Published by IOP Publishing in Nanotechnology
- Vol. 14 (1) , 65-68
- https://doi.org/10.1088/0957-4484/14/1/315
Abstract
No abstract availableKeywords
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