Local investigation of recombination at grain boundaries in silicon by grain boundary-electron beam induced current
- 15 July 1993
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 74 (2) , 1169-1178
- https://doi.org/10.1063/1.354917
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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