Buckling behavior of boron-doped p/sup +/ silicon diaphragms
- 9 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
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- Residual stress and mechanical properties of boron-doped p+-silicon filmsSensors and Actuators A: Physical, 1990
- A study on silicon-diaphragm bucklingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1990
- Silicon as a mechanical materialProceedings of the IEEE, 1982