Depth profiling of heavy-ion-mixed TiN films
- 1 April 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 50 (1-4) , 10-18
- https://doi.org/10.1016/0168-583x(90)90320-t
Abstract
No abstract availableKeywords
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