Measurement of the carrier lifetime by an impedance technique
- 30 April 1971
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 14 (4) , 289-294
- https://doi.org/10.1016/0038-1101(71)90071-2
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Measurement of the effective carrier lifetime by a distortion techniqueSolid-State Electronics, 1970
- Measurement of the effective carrier lifetime by a distortion techniqueSolid-State Electronics, 1967