Electron beam induced current studies of MS and MIS devices on CdS
- 16 January 1980
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 57 (1) , 253-262
- https://doi.org/10.1002/pssa.2210570128
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Blue light emission in forward-biased ZnS MIS diodesPhysica Status Solidi (a), 1978
- Forward-bias electroluminescence in ZnSe diodesPhysica Status Solidi (a), 1977
- Nondestructive determination of the depth of planar p-n junctions by scanning electron microscopyIEEE Transactions on Electron Devices, 1977
- Diffusion length determination in thin-film CuxS/CdS solar cells by scanning electron microscopyJournal of Applied Physics, 1977
- Electroluminescence in zinc selenideSolid-State Electronics, 1975
- The preparation of large single crystals of cadmium sulphideBritish Journal of Applied Physics, 1966