Analysis of Infrared Interference Filters by Means of an Analog Computer*

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Abstract
An earlier simulator is modified to make any dc analog computer suitable for calculating multilayer filter characteristics. The analog is used to investigate special effects in bandpass filters containing more than one multiple-half-wave layer including effects of errors in thickness, changing the order of a multiple-half-wave layer, and increasing the number of layers. A five-layer low-pass filter is studied by investigating the effects of changing the substrate index and thickness of one layer. The transmittance of an experimental low-pass filter is given and shown to be in good agreement with theory.

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