Application of Factor Analysis to the Resolution of Overlapping XPS Spectra
- 1 July 1982
- journal article
- research article
- Published by SAGE Publications in Applied Spectroscopy
- Vol. 36 (4) , 428-430
- https://doi.org/10.1366/0003702824639565
Abstract
Factor analysis has been used to resolve the overlapping XPS spectra obtained in the x-ray-induced transformation of Pt(en)2(OH)2Cl2 to Pt(en)2Cl2. This is achieved without prior knowledge of the data set nor the establishment of any initial curve fitting criteria.Keywords
This publication has 12 references indexed in Scilit:
- A kinetic method for correcting the X-ray photoelectron spectra of radiation-sensitive compoundsJournal of Electron Spectroscopy and Related Phenomena, 1981
- Factor analysis of some physical and structural properties influencing the fluorescence lifetimes of an atabrine homologous seriesAnalytical Chemistry, 1980
- X-ray photoelectron spectroscopic (X-p.e.s.) studies on in situ photoinduced decomposition of inorganic molecular ions. Part 2.—Na[ClOx] system: mechanistic (x= 3, 4) and variable-temperature (x= 3) investigationsJournal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 1978
- Factor analysis of the mass spectra of mixturesAnalytical Chemistry, 1976
- Factor analysis of solute parameters in ether-stationary phase interactionsJournal of Chromatography A, 1975
- Methods of factor analysis of mass spectraAnalytical Chemistry, 1975
- Radiation damage in some platinum(IV) complexes produced during soft X-ray photoelectron spectroscopic studiesJournal of the Chemical Society, Faraday Transactions 2: Molecular and Chemical Physics, 1975
- Application of Factor Analysis to Gas–Liquid ChromatographyCanadian Journal of Chemistry, 1972
- Self Modeling Curve ResolutionTechnometrics, 1971
- The Stereochemistry of Complex Inorganic Compounds. X. The Stereoisomers of Dichlorobis-(ethylenediamine)-platinum (IV) Chloride1Journal of the American Chemical Society, 1950