Real time monitoring of filament-assisted chemically vapor deposited diamond by spectroscopic ellipsometry
- 10 December 1991
- journal article
- Published by Elsevier in Surface and Coatings Technology
- Vol. 49 (1-3) , 381-386
- https://doi.org/10.1016/0257-8972(91)90087-d
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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