Oxide and interface properties of anodic oxide MOS structures on III–V compound semiconductors
- 1 January 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 56 (1-2) , 173-182
- https://doi.org/10.1016/0040-6090(79)90062-2
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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