Method for Azimuthal Alignment in Ellipsometry
- 1 October 1971
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 10 (10) , 2370-2371
- https://doi.org/10.1364/ao.10.002370
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- A modified method for calibrating the analyser and the polarizer in an ellipsometerJournal of Physics D: Applied Physics, 1970
- Azimuthal Misalignment and Surface Anisotropy as Sources of Error in EllipsometryApplied Optics, 1970
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
- On the Analysis of Elliptically Polarized Radiation in the Infrared RegionJournal of the Optical Society of America, 1954
- Optical Measurements of Surface Films. IReview of Scientific Instruments, 1948
- The Polarimetric Determination of Optical PropertiesJournal of the Optical Society of America, 1936