X-Ray Diffuse Scattering on Self-Organized Mesoscopic Structures
- 1 February 2002
- journal article
- research article
- Published by Wiley in Crystal Research and Technology
- Vol. 37 (1) , 3-34
- https://doi.org/10.1002/1521-4079(200202)37:1<3::aid-crat3>3.0.co;2-9
Abstract
No abstract availableKeywords
This publication has 40 references indexed in Scilit:
- Growth, structural, and electrical investigation of self-assembled InAs quantum wires on (001)InPJournal of Crystal Growth, 2000
- Cross-sectional scanning-tunneling microscopy of stacked InAs quantum dotsApplied Physics Letters, 1999
- Self-organized ordering of Si1-xGexnanoscale islands studied by grazing incidence small-angle x-ray scatteringJournal of Physics D: Applied Physics, 1999
- X-ray structure investigation of lateral surface nanostructures - a full quantitative analysis of non-uniform lattice strainJournal of Physics D: Applied Physics, 1999
- Strain-induced island scaling during Si1−xGex heteroepitaxyApplied Physics Letters, 1998
- Grazing-incidence x-ray scattering from stepped interfaces in AlAs/GaAs superlatticesPhysical Review B, 1997
- Diffuse scattering from interface roughness in grazing-incidence x-ray diffractionPhysical Review B, 1996
- Roughness of heterointerfaces and averaging effects by excitons: Interpretation of cathodoluminescence imagesPhysical Review B, 1995
- Morphological instabilities on exactly oriented and on vicinal GaAs (001) surfaces during molecular beam epitaxyJournal of Crystal Growth, 1995
- Cathodoluminescence microscopy of inhomogeneities in semiconductor heterostructuresPhysica Status Solidi (a), 1995