A High Intensity Source of Polarized X-Rays for Fluorescent Excitation Analysis (FEA)
- 1 January 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 24 (1) , 525-531
- https://doi.org/10.1109/tns.1977.4328736
Abstract
FEA is being used in medicine to substitute radiotracers and chemical analysis of stable tracers. Excitation with polarized x-rays reduces tracer working levels: Since they scatter at preferential angles they reduce the number of photons reaching the detector, thus decreasing system dead time and background. The use of a 160KV 19mA x-ray tube for FEA of iodine (and neighboring elements) realizes count-rates of 2.5 cts/sec/ppmI and background reductions from 11.5 ppmI (when using Am-241 excitation) to 5.7 ppmI. These early results indicate that counting time to realize constant quantitation accuracy can be reduced by 90%. Since the use of the x-ray tube results in a 50% increase in the cost of the source-excited automated system, the ten-fold reduction in analysis time makes this a practical approach.Keywords
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