Background reduction in x-ray fluorescence spectra using polarization
- 15 February 1974
- journal article
- research article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 115 (1) , 297-299
- https://doi.org/10.1016/0029-554x(74)90459-5
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Comparison of particle and photon excited X-ray fluorescence applied to trace element measurements of environmental samplesNuclear Instruments and Methods, 1973
- Utilization of Increased Sensitivity of X-ray Fluorescence Spectrometry due to Polarization of the Background RadiationNature, 1963
- A Measurement of the Polarization of Secondary X-Rays*Journal of the Optical Society of America, 1924