Comparison of particle and photon excited X-ray fluorescence applied to trace element measurements of environmental samples
- 1 February 1973
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 106 (3) , 525-538
- https://doi.org/10.1016/0029-554x(73)90318-2
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Semiconductor Detector X-Ray Fluorescence Spectrometry Applied to Environmental and Biological AnalysisIEEE Transactions on Nuclear Science, 1972
- High Rate X-Ray Fluorescence Analysis by Pulsed ExcitationIEEE Transactions on Nuclear Science, 1972
- Sensitivity versus target backings for elemental analysis by alpha excited X-ray emissionNuclear Instruments and Methods, 1972
- Observation of electron standing waves in Mg by tunnelingSolid State Communications, 1972
- An investigation of the analytical capabilities of X-ray emission induced by high energy alpha particlesNuclear Instruments and Methods, 1971
- X-ray emission induced by 30 to 80 MeV alpha particlesNuclear Physics A, 1970
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- Factors determining the ultimate detection sensitivity of Ge(Li) gamma-ray spectrometersNuclear Instruments and Methods, 1970
- U.S. Geological Survey standards—II. First compilation of data for the new U.S.G.S. rocksGeochimica et Cosmochimica Acta, 1969
- Limits for qualitative detection and quantitative determination. Application to radiochemistryAnalytical Chemistry, 1968