Sensitivity versus target backings for elemental analysis by alpha excited X-ray emission
- 1 May 1972
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 100 (3) , 397-402
- https://doi.org/10.1016/0029-554x(72)90813-0
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- An investigation of the analytical capabilities of X-ray emission induced by high energy alpha particlesNuclear Instruments and Methods, 1971
- Precise Test of theDependence of X-Ray Emission Induced byParticles and DeuteronsPhysical Review Letters, 1971
- X-ray emission induced by 30 to 80 MeV alpha particlesNuclear Physics A, 1970
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970