The tetrahedral tip as a probe for scanning near‐field optical microscopy at 30 nm resolution
- 1 December 1994
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 176 (3) , 231-237
- https://doi.org/10.1111/j.1365-2818.1994.tb03520.x
Abstract
No abstract availableKeywords
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