In situ monitoring of InAs-on-GaAs quantum dot formation in MOVPE by reflectance-anisotropy-spectroscopy and ellipsometry
- 1 November 1996
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 107, 203-211
- https://doi.org/10.1016/s0169-4332(96)00487-4
Abstract
No abstract availableKeywords
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